Determining the Parameters of the SIS-Mixer at an Intermediate Frequency
Vodzianovskii Ya. O.1,2, Khudchenko A. V.1,3, Koshelets V. P.1,3
1Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences, Moscow, Russia
2Moscow Institute of Physics and Technology (National Research University), Dolgoprudny, Moscow Region, Russia
3Astro Space Center of P.N. Lebedev Physical Institute of the Russian Academy of Sciences, Moscow, Russia

The level of signal reflection at an intermediate frequency from an SIS-mixer was calculated and experimentally measured. The measurement was performed for the mixer in operation, namely, it was biased by voltage and the signal of the local oscillator was applied. It is shown that the power reflection coefficient can vary from -20 to -3 dB depending on the operating point. An experimental method for determining the impedance of the supply line of the SIS-mixer is proposed and tested. Keywords: superconductor-insulator-superconductor tunnel junction, intermediate frequency, submillimeter SIS-mixer.
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