Physics of the Solid State
Volumes and Issues
Magnetoresistive characteristics of the SrIrO3/La2/3Sr1/3MnO3 heterostructure
Constantinian K. Y.1, Ulev G.D.1,2, Mashirov A. V. 1, Orlov A. P. 1, Moskal I. E.1, Ovsyannikov G. A.1
1Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences, Moscow, Russia
2Moscow Institute of Physics and Technology (National Research University), Dolgoprudny, Moscow Region, Russia
Email: karen@hitech.cplire.ru, gdulev@edu.hse.ru, gena@hitech.cplire.ru

PDF
We report on results of experimental studies of thin-film heterostructure SrIrO3/La2/3Sr1/3MnO3 grown epitaxially on NdGaO3 substrate. A transitional layer is formed at the interface between paramagnetic semimetal SrIrO3, exhibiting strong spin-orbit interaction, and the spin-polarized ferromagnet La2/3Sr1/3MnO3. Single layers of SrIrO3 and La2/3Sr1/3MnO3 were studied as well. The temperature dependences of electronic conductivity, magnetoresistance, and Hall effect responses obtained at magnetic fields H=0-7 T and temperatures T=2-300 K are discussed. Keywords: heterostructure, spin-orbit interaction, strontium iridate, manganite, magnetoresistance, Hall effect.
  1. S. Chen, Y. Ning, C. Tang, L. Dai, S. Zeng, K. Han, J. Zhou, M. Yang, Y. Guo, C. Cai, A. Ariando, A.T.S. Wee, X. Yin. Adv. Electron. Mater. 10, 2300730 (2024). DOI: 10.1002/aelm.202300730
  2. M. Yoo, J. Tornos, A. Sander, L. Lin, N. Mohanta, A. Peralta, D. Sanchez-Manzano, F. Gallego, D. Haskel, J.W. Freeland, D.J. Keavney, Y. Choi, J. Strempfer, X. Wang, M. Cabero, H.B. Vasili, M. Valvidares, G. Sanchez-Santolino, J.M. Gonzalez-Calbet, A. Rivera, C. Leon, S. Rosenkranz, M. Bibes, A. Barthelemy, A. Anane, E. Dagotto, S. Okamoto, S.G.E. te Velthuis, J. Santamaria, J.E. Villegas. Nat. Comm. 12, 3283 (2021). DOI: 10.1038/s41467-021-23489
  3. S. Jana, T. Senapati, S.G. Bhat, S.N. Sarangi, K. Senapati, D. Samal. Phys. Rev. B 107, 134415 (2023). DOI: 10.1103/PhysRev B.107.134415
  4. G. Cao, P. Schlottmann. Rep. Progress in Phys. 81, 042502 (2018). DOI: 10.1088/1361-6633/aaa979
  5. G.A. Ovsyannikov, K.I. Konstantinyan, G.D. Ul'ev, I.E. Moskal. JETP Lett. 121, 5, 381, (2025). DOI: 10.1134/S002136402560017X
  6. T. Nan, S. Emori, C.T. Boone, X. Wang, T.M. Oxholm, J.G. Jones, B.M. Howe, G.J. Brown, N.X. Sun. Phys. Rev. B 91, 214416 (2015). DOI: 10.1103/PhysRevB.91.214416
  7. G.D. Ulev, K.Y. Constantinian, I.E. Moskal', G.A. Ovsyannikov, A.V. Shadrin. J. Commun. Technol. Electronics 68, 10, 1201 (2023). DOI: 10.1134/S1064226923100194
  8. Y.-T. Chen, S. Takahashi, H. Nakayama, M. Althammer, S.T.B. Goennenwein, E. Saitoh, G.E.W. Bauer. J. Phys. D: Condens. Matter 28, 103004 (2016). DOI: 10.1088/0953-8984/28/10/103004
  9. N. Manca, D.J. Groenendijk, I. Pallecchi, C. Autieri, L.M.K. Tang, F. Telesio, G. Mattoni, A. McCollam, S. Picozzi, A.D. Caviglia. Phys. Rev. B 97, 081105(R) (2018). DOI: 10.1103/PhysRevB.97.081105
  10. I.M. Dildar, C. Beekman, X. He. J. Aarts. Phys. Rev. B 85, 205103 (2012). DOI: 10.1103/PhysRevB.85.205103
  11. F.-X. Wu, J. Zhou, L.Y. Zhang, Y.B. Chen, S. Zhang, Z. Gu, S. Yao, Y. Chen. J. Phys.: Condens. Matter. 25, 125604 (2013). DOI: 10.1088/0953-8984/25/12/125604
  12. A. Biswas, Y.H. Jeong. Current Appl. Phys. 17, 605--614 (2017). DOI: 10.1016/j.cap.2016.09.020
  13. L.E. Calvet, G. Agnus, P. Lecoeur. J. Vac. Sci. Technol. A 37, 031504 (2019). DOI: 10.1116/1.5085669
  14. I.E. Moskal, A.M. Petrzhik, Y.V. Kislinskii, A.V. Shadrin, G.A. Ovsyannikov, N.V. Dubitskiy. Bulletin RAS: Physics, 88, 4, 582--585 (2024). DOI: 10.1134/S1062873823706360
  15. G.A. Ovsyannikov, K.Y. Constantinian, V.A. Shmakov, A.L. Klimov, E.A. Kalachev, A.V. Shadrin, N.V. Andreev, F.O. Milovich, A.P. Orlov, P.V. Lega. Phys. Rev. B 107, 144419 (2023). DOI: 10.1103/PhysRevB.107.144419
  16. J. Lindemuth. Hall Effect Measurement Handbook: A Fundamental Tool for Semiconductor Material Characterization. (Lake Shore Cryotronics, Inc. 2020).
  17. X. Wang, X.-G. Zhang. Phys. Rev. Lett. 82, 21, 4276 (1999). DOI: 10.1103/PhysRevLett.82.4276
  18. P.A. Lee, T.V. Ramakrishnan. Phys. Rev. B 26, 4008 (1982)
  19. W. Niu, M. Gao, X. Wang, F. Song, J. Du, X. Wang, Y. Xu, R. Zhang. Sci. Reports 6, 26081 (2016). DOI: 10.1038/srep26081
  20. Y. Lyanda-Geller, S.H. Chun, M.B. Salamon, P.M. Goldbart, P.D. Han, Y. Tomioka, A. Asamitsu, Y. Tokura. Phys. Rev. B 63, 184426 (2001). DOI: 10.1103/PhysRevB.63.184426
  21. R.S. Helen, W. Prellier, P. Padhan. J. Appl. Phys. 128, 033906 (2020). DOI: 10.1063/5.0014909
Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru