ФТТ, 2008, том 50, выпуск 9
ФТТ, 2008, том 50, выпуск 9
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Relaxation of electronic excitations in wide-gap crystals studied by femtosecond interferometry technique
V.Nagirnyi, G.Geoffroy, S.Guizard, M.Kirm, A.Kotlov
Institute of Physics, University of Tartu,
51014 Tartu, Estonia
Laboratoire des Solides Irradies, CEA--CNRS Ecole Polytechnique,
91128 Palaiseau, France
E-mail: vetal@fi.tartu.ee
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The method of time-resolved interferometry with the 100 fs temporal resolution was applied for the first time to study the relaxation processes of electronic excitations in complex oxides, tungstate crystals of CdWO with the lattice of the wolframite type and CaWO with the scheelite type lattice. Two stages of charge carrier relaxation, its very fast trapping in 200 fs resulting in self-trapped exciton formation and a relatively slow relaxation process in a picosecond time range probably due to the configurational relaxation within the oxyanion molecule and modification of the surrounding lattice, were revealed in tungstate crystals. The corresponding models of self-trapped exciton creation in tungstate crystals are discussed. A financial support by the Access to Research Infrastructures activity in the FP6 of the EU (contract RII3-CT-2003-506350, Laserlab Europe) as well as by the Estonian Science Foundation (Grants N 6538 and 7274) for conducting the research are gratefully acknowledged. PACS: 72.20.Jv, 78.47.+p |
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