Optical measurements of shrinkage and temperature distribution during microwave sintering
Egorov S. V.1, Eremeev A. G.1, Rybakov K. I.1, Sorokin A. A.1, Kholoptsev V. V.1
1Federal Research Center A.V. Gaponov-Grekhov Institute of Applied Physics of the Russian Academy of Sciences, Nizhny Novgorod, Russia
Email: rybakov@ipfran.ru

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A combined optical diagnostics method for high-temperature microwave processing of materials is described. It enables rapid acquisition of information on changes in the size and shape of an object and on the temperature distribution over its surface based on the processing of infrared digital images. The application of this method to rapid microwave reaction sintering of Ce:YAG + Al2O3 composite ceramic materials is discussed. The design of the developed device for extracting optical radiation from the workchamber is described, ensuring protection of the sensitive elements of the optical system from intense microwave radiation. Keywords: high-temperature microwave processing of materials, optical dilatometry, yttrium aluminum garnet, gyrotron.
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