Optical properties of porous silicon irradiated with a nanosecond ytterbium laser
Rybina N. V.1, Rybin N. B.1, Khilov V. S.2, Tregulov V. V.2, Ivanov A. I.2, Aiyyzhy K. O.3, Melnik N. N.4
1Ryazan State Radio Engineering University, Ryazan, Russia
2Ryazan State University named for S. Yesenin, Ryazan, Russia
3Prokhorov General Physics Institute of the Russian Academy of Sciences, Moscow, Russia
4Lebedev Physical Institute, Russian Academy of Sciences, Moscow, Russia
Email: nikolay.rybin@yandex.ru
It is shown that by changing the parameters of irradiation with a pulsed nanosecond ytterbium fiber laser, it is possible to influence the information-correlation, fractal and optical properties of the surface of porous silicon films. Using the analysis of the reflection spectra and Raman scattering of light, the relationship between the parameters of laser irradiation of porous films and their optical characteristics is established. The studied semiconductor structures can be relevant for creating antireflective layers of silicon solar cells, as well as chemical sensors. Keywords: porous silicon, nanosecond laser pulses, morphology, mutual information, fractal analysis, Raman scattering, surface reflectance spectra.
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