Ruzhevich M. S. 1, Mynbaev K. D. 1,2, Firsov D. D. 3, Chumanov I. V. 3, Komkov O. S. 3, Varavin V. S. 4, Yakushev M. V. 4
1ITMO University, St. Petersburg, Russia
2Ioffe Institute, St. Petersburg, Russia
3St. Petersburg State Electrotechnical University “LETI", St. Petersburg, Russia
4Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia
Email: max.ruzhevich@niuitmo.ru, karim.mynbaev@niuitmo.ru, d.d.firsov@gmail.com
The results of a study of photoreflectance of Cd0.3Hg0.7Te films grown by molecular beam epitaxy are presented. The results of photoreflectance measurements were compared with data from studies of photoluminescence and optical transmittance of films after growth and after various types of annealing. For films after annealing, an improvement in quality was found, expressed in a decrease in the half-width of the photoreflectance peak. Keywords: solid solutions, CdHgTe, photoreflectance.
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