Technical Physics Letters
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A phase detection method for visualizing single- and bilayer graphene on a SiC surface
Rodionchikova A. D.1, Dunaevskiy M. S.1, Gushchina E. V.1, Priobrazhenskii S. I.1, Lebedev S. P.1, Lebedev A. A.1
1Ioffe Institute, St. Petersburg, Russia
Email: a.rodionchikovaa@mail.ru

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A phase detection method for visualizing single- and bilayer graphene regions on a SiC surface is proposed. The phase detection method demonstrates a lateral resolution of 5-10 nm, significantly higher than that of the traditional Kelvin probe microscopy method. The single-pass phase detection method significantly accelerates image acquisition and reduces the risk of probe tip degradation. Keywords: scanning probe microscopy, Kelvin probe microscopy, phase detection method, graphene, bilayer graphene, silicon carbide.
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