Reproducibility of the electrophysical characteristics of the prototype transistor structures based on the graphene-CaF2-Si(111) heterosystem
Vexler M. I.1, Illarionov Y. Y.1,2, Banshchikov A. G.1, Knobloch T.2, Ivanov I. A.1, Grasser T.2, Sokolov N. S.1, Yusupova Sh. A.1
1Ioffe Institute, St. Petersburg, Russia
2Institute for Microelectronics, Vienna University of Technology, Vienna, Austria
Email: vexler@mail.ioffe.ru
Statistical distributions of the current have been studied for the set of the prototype transistor structures with a two-dimensional graphene film over the insulating calcium fluoride layer grown by molecular beam epitaxy. Such material combination is new for this field. The obtained characteristics were rather attractive, keeping the spread parameters (such as dispersion of the drain current or of the position of charge neutrality point at the current and voltage scale) within the tolerable limits. The studies in this area are important for development of "two-dimensional" electronics based on transistors whose prototype structures were under consideration in the work. Keywords: 2D electronics, graphene, calcium fluoride, reliability.
- Yu.Yu. Illarionov, A.G. Banshchikov, T. Knobloch, I.A. Ivanov, T. Grasser, N.S. Sokolov, M.I. Vexler. Pis'ma ZhTF, 50 (4), 27 (2024). (in Russian). DOI: https://doi.org/10.61011/PJTF.2024.04.57097.19739
- Y.Y. Illarionov, T. Knobloch, B. Uzlu, A.G. Banshchikov, I.A. Ivanov, V. Sverdlov, M. Otto, L.S. Stoll, M.I. Vexler, M. Waltl, Z. Wang, B. Manna, D. Neumaier, M.C. Lemme, N.S. Sokolov, T. Grasser. npj 2D Mater. Appl., 8, 23 (2024). DOI: https://doi.org/10.1038/s41699-024-00461-0
- M. Lemme, D. Akinwande, C. Huyghebaert, C. Stampfer. Nature Commun., 13, 1392 (2022). DOI: https://doi.org/10.1038/s41467-022-29001-4
- A. Beraud, M. Sauvage, C. Bazan, M. Tie, A. Bencherif, D. Bouilly. Analyst, 146, 403 (2021). DOI: https://doi.org/10.1039/d0an01661f
- W. Hayes. Crystals with the fluorite structure (Clarendon Press, 1974)
- M. Sugiyama, M. Oshima. Microelectron. J., 27, 361 (1996). DOI: https://doi.org/10.1016/0026-2692(95)00062-3
- A. Ishizaka, Y. Shiraki. J. Electrochem. Soc., 133, 666 (1986). DOI: https://doi.org/10.1149/1.2108651
- X. Xin, J. Chen, L. Ma, T. Ma, W. Xin, H. Xu, W. Ren, Y. Liu. Small Methods, 7, 2300156 (2023). DOI: https://doi.org/10.1002/smtd.202300156
- S.E. Tyaginov, M.I. Vexler, A.F. Shulekin, I.V. Grekhov. Solid-State Electron., 49, 1192 (2005). DOI: https://doi.org/10.1016/j.sse.2005.04.007
- F. Schwierz. Nature Nanotechnol., 5, 487 (2010). DOI: https://doi.org/10.1038/nnano.2010.89
- T.P. Smith, P.J. Stiles, J.M. Phillips, W.M. Augustyniak. Appl. Phys. Lett., 45, 907 (1984). DOI: https://doi.org/10.1063/1.95410
- S. Miyamoto, H. Matsudaira, H. Ishizaka, K. Nakazawa, H. Taniuchi, H. Umezawa, M. Tachikia, H. Kawarada. Diamond Relat. Mater., 12, 399 (2003). DOI: https://doi.org/10.1016/S0925-9635(03)00034-7
- M. Watanabe, T. Funayama, T. Teraji, N. Sakamaki. Jpn. J. Appl. Phys., 39, L716-L719 (2000). DOI: https://doi.org/10.1143/JJAP.39.L716
- C.R. Wang, M. Bierkandt, S. Paprotta, T. Wietler, K.R. Hofmann. Appl. Phys. Lett., 86, 033111 (2005). DOI: https://doi.org/10.1063/1.1853522
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