Technical Physics Letters
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Theoretical analysis of compositional profiles in axial heterostructures based on AlGaAs nanowires
Dubrovskii V. G.1, Mikushev S. V.1, Shtrom I. V.1,2
1St. Petersburg State University, St. Petersburg, Russia
2Institute for Analytical Instrumentation of the Russian Academy of Sciences, Saint Petersburg, Russia
Email: i.shtorm@spbu.ru

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We analyze the compositional profiles across axial heterostructures in GaAs/AlxGa1-xAs/GaAs and AlxGa1-xAs/GaAs/AlxGa1-xAs nanowires (NWs). The difference is in the catalyst type (Ga or Au) and in the material from which the heterostructure starts (binary GaAs NW or ternary AlxGa1-xAs NW). We calculate the interfacial profiles and show that the use of Au catalyst significantly broadens the interface due to reservoir effect. This feature is experimentally confirmed. Keywords: semiconductor nanowires AlGaAs, axial heterostructures, compositional profiles, modeling.
  1. P.C. McIntyre, A. Fontcuberta i Morral, Mater. Today Nano, 9, 100058 (2020). DOI: 10.1016/j.mtnano.2019.100058
  2. G. Boras, X. Yu, H. Liu, J. Semicond., 40, 101301 (2019). DOI: 10.1088/1674-4926/40/10/101301
  3. J.K. Hyun, S. Zhang, L.J. Lauhon, Annu. Rev. Mater. Res., 43, 451 (2013). DOI: 10.1146/annurev-matsci-071312-121659
  4. V.G. Dubrovskii, J. Phys. D, 50, 453001 (2017). DOI: 10.1088/1361-6463/aa87a7
  5. M. Ghasemi, E.D. Leshchenko, J. Johansson, Nanotechnology, 32, 072001 (2020). DOI: 10.1088/1361-6528/abc3e2
  6. E.D. Leshchenko, N.V. Sibirev, Nanomaterials, 14, 1816 (2024). DOI: 10.3390/nano14221816
  7. V.G. Dubrovskii, F. Glas, in Fundamental properties of semiconductor nanowires, ed. by N. Fukata, R. Rurali (Springer, Singapore, 2020), p. 3--107. DOI: 10.1007/978-981-15-9050-4_1
  8. V.G. Dubrovskii, I.V. Shtrom, R.R. Reznik, Yu.B. Samsonenko, A.I. Khrebtov, I.P. Soshnikov, S. Rouvimov, N. Akopian, T. Kasama, G.E. Cirlin, Cryst. Growth Des., 16, 7251 (2016). DOI: 10.1021/acs.cgd.6b01412
  9. L. Leandro, C.P. Gunnarsson, R. Reznik, K.D. Jons, I. Shtrom, A. Khrebtov, T. Kasama, V. Zwiller, G. Cirlin, N. Akopian, Nano Lett., 18, 7217 (2018). DOI: 10.1021/acs.nanolett.8b03363
  10. L. Leandro, J. Hastrup, R. Reznik, G. Cirlin, N. Akopian, npj Quantum Inform., 6, 93 (2020). DOI: 10.1038/s41534-020-00323-9
  11. D. Barettin, I.V. Shtrom, R.R. Reznik, S.V. Mikushev, G.E. Cirlin, M. Auf der Maur, N. Akopian, Nano Lett., 23, 895 (2023). DOI: 10.1021/acs.nanolett.2c04184
  12. G. Priante, F. Glas, G. Patriarche, K. Pantzas, F. Oehler, J.C. Harmand, Nano Lett., 16, 1917 (2016). DOI: 10.1021/acs.nanolett.5b05121
  13. G. Boras, X. Yu, H. Aruni Fonseka, G. Davis, A.V. Velichko, J.A. Gott, H. Zeng, S. Wu, P. Parkinson, X. Xu, D. Mowbray, A.M. Sanchez, H. Liu, J. Phys. Chem. C, 125, 14338 (2021). DOI: 10.1021/acs.jpcc.1c03680
  14. G. Boras, H. Zeng, S. Church, R. Juluri, A. Velichko, H. Deng, H. Jia, F. Alvarado, Z. Yin, C. Chen, J. Park, M. Tang, D. Mowbray, A.M. Sanchez, P. Parkinson, H. Liu, Adv. Mater. Interfaces, 13, e00938 (2026). DOI: 10.1002/admi.202500938
  15. F. Glas, Cryst. Growth Des., 17, 4785 (2017). DOI: 10.1021/acs.cgd.7b00732
  16. V.G. Dubrovskii, A.A. Koryakin, N.V. Sibirev, Mater. Des., 132, 400 (2017). DOI: 10.1016/j.matdes.2017.07.012
  17. J. Johansson, M. Ghasemi, Phys. Rev. Mater., 1, 040401(R) (2017). DOI: 10.1103/PhysRevMaterials.1.040401
  18. V.G. Dubrovskii, Phys. Rev. Mater., 7, 096001 (2023). DOI: 10.1103/PhysRevMaterials.7.096001
  19. V.G. Dubrovskii, Phys. Rev. Mater., 8, 076003 (2024). DOI: 10.1103/PhysRevMaterials.8.076003

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