Formation of channel silicon to create filter layers
Ivlev K. E. 1, Bolotov V. V. 1, Ponomareva I. V. 1, Knyazev E.V. 1
1Omsk Scientific Center, Siberian Branch, Russian Academy of Sciences, Omsk, Russia
Email: ivlev@obisp.oscsbras.ru, bolotov@obisp.oscsbras.ru, poni@obisp.oscsbras.ru, knyazev@obisp.oscsbras.ru

PDF
The features of the formation of porous layers on substrates of low doped silicon of n-type conductivity by anodic etching using illumination are considered. The formation of microporous silicon layer on the walls of macropores was found. It is shown that the illumination modes strongly influence the morphological parameters of the obtained layers. After exposure to alkali, macroporous layers with pore diameters up to 550 nm were obtained, which can be used to create filter layers. Keywords: porous silicon, electrochemical etching, gas filters, scanning electron microscopy.
  1. Zh.-Y. Tan, Y.-G. Yuan, H. An, Y. Zou, J.-Ch. Wu, Ch.-Y. Zhan. J. Alloys Compd., 927, 167055 (2022). DOI: 10.1016/j.jallcom.2022.167055
  2. R. Chhasatia, M.J. Sweetman, B. Prieto-Simon, N.H. Voelcker. Sensors Actuators B: Chem., 273, 1313 (2018). DOI: 10.1016/j.snb.2018.07.021
  3. N.V. Latukhina, D.A. Lizunkova, G.A. Rogozhina, I.M. Zhiltsov, M.V. Stepikhova, V.I. Chepurnov. Fotonika, 12, 5 (508) (2018). (in Russian). DOI: 10.22184/1993-7296.2018.12.5.508.513
  4. R. Vercauteren, G. Scheen, J.-P. Raskin, L.A. Francis. Sensors Actuators A: Phys., 318, 112486 (2021). DOI: 10.1016/j.sna.2020.112486
  5. R.W. Baker. Membrane technology and applications (John Wiley \& Sons, N. Y., 2004) p. 301
  6. E.V. Astrova, A.A. Nechitailov, A.G. Zabrodsky. Al'ternativnaya energetika i ekologiya: mezhdunar. nauch. zhurn., 2 (46), 60 (2007) (in Russian)
  7. R.B. Bird, W.E. Stewart, E.N. Lightfoot. Transport phenomena (John Wiley \& Sons, Inc., USA, 2002) p. 11
  8. V. Lehmann, R. Steng, A. Luigart. Mater. Sci. Eng. B, 69-70, 11 (2000)
  9. V.V. Bolotov, K.E. Ivlev, E.V. Knyazev, I.V. Ponomareva, V.E. Roslikov. FTP, 54 (5), 504 (2020) (in Russian). DOI: 10.21883/FTP.2020.05.49269.9340
  10. J. Park, B. Kim. Microelectron. Eng., 200, 32 (2018). DOI: 10.1016/j.mee.2018.08.005
  11. Z.-Y. Tan, Y.-G. Yuan, H. An, Y. Zou, J.-Ch. Wu, Ch.-Y. Zhan. Surf. Coat. Technol., 365, 109 (2019). DOI: 10.1016/j.surfcoat.2018.07.051
  12. V. Lehmann. J. Electrochem. Soc., 140 (10), 2836 (1993)
  13. M.H. Al Rifai, M. Christophersen, S. Ottow, J. Carstensen, H. Foll. J. Electrochem. Soc., 147 (2) 627 (2000)

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru