Planar (lateral) light-emitting diodes with Ge(Si) nanoislands embedded in a photonic crystal
Shmagin V. B. 1, Novikov A. V. 1,2, Yablonskiy A. N. 1, Stepikhova M. V. 1, Yurasov D. V. 1, Mikhailov A. N. 2, Tetelbaum D. I. 2, Rodyakina E. E. 3,4, Morozova E. E.1, Shengurov D. V. 1, Kraev S. A.1, Yunin P. A. 1, Shaleev M. V. 1, Belov A. I. 2
1Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhny Novgorod, Russia
2Lobachevsky State University, Nizhny Novgorod, Russia
3Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia
4Novosibirsk State University, Novosibirsk, Russia
Email: shm@ipmras.ru, anov@ipmras.ru, yablonsk@ipmras.ru, mst@ipmras.ru, Inquisitor@ipmras.ru, mian@nifti.unn.ru, tetelbaum@phys.unn.ru, rodyakina@isp.nsc.ru, elenamor@ipmras.ru, shen@ipmras.ru, kraev@ipmras.ru, yunin@ipmras.ru, shaleev@ipmras.ru, belov@nifti.unn.ru

PDF
Lateral p-i-n-LEDs were fabricated on structures with Ge(Si) self-assembled islands using local ion implantation. The use of preliminary amorphization and solid-phase recrystallization of the implanted areas allowed to decrease the impurity activation temperature down to 600oC, which significantly reduced the detrimental effect of post-implantation annealing on the luminescence signal of Ge(Si) islands at room temperature in the range of 1.3-1.55 microns. The electroluminescence signal from Ge(Si) islands was increased by more than an order of magnitude due to the embedding of photonic crystals in the i-region of diodes. Keywords: silicon, light emitting diodes, Ge(Si) islands, photonic crystals, implantation.
  1. N.V. Vostokov, Yu.N. Drozdov, Z.F. Krasil'nik, D.N. Lobanov, A.V. Novikov, A.N. Yablonskii, JETP Lett., 76 (6), 365 (2002). DOI: 10.1134/1.1525038
  2. M. Brehm, M. Grydlik, Nanotechnology, 28, 392001 (2017). DOI: 10.1088/1361-6528/aa8143
  3. V. Rutckaia, F. Heyroth, A. Novikov, M. Shaleev, M. Petrov, J. Schilling, Nano Lett., 17, 6886 (2017). DOI: 10.1021/acs.nanolett.7b03248
  4. M. Schatzl, F. Hackl, M. Glaser, P. Rauter, M. Brehm, L. Spindlberger, A. Simbula, M. Galli, Th. Fromherz, F. Schaffler, ACS Photon., 4, 665 (2017). DOI: 10.1021/acsphotonics.6b01045
  5. S.A. Dyakov, M.V. Stepikhova, A.A. Bogdanov, A.V. Novikov, D.V. Yurasov, M.V. Shaleev, Z.F. Krasilnik, S.G. Tikhodeev, N.A. Gippius, Laser Photon. Rev., 15, 2000242 (2021). DOI: 10.1002/lpor.202000242
  6. X. Xu, T. Chiba, T. Nakama, T. Maruizumi, Y. Shiraki, Appl. Phys. Express, 5, 102101 (2012). DOI: 10.1143/APEX.5.102101
  7. L. Pelaz, L.A. Marques, J. Barbolla, J. Appl. Phys., 96, 5947 (2004). DOI: 10.1063/1.1808484
  8. G. Capellini, M. De Seta, F. Evangelisti, Appl. Phys. Lett., 78, 303 (2001). DOI: 10.1063/1.1339263

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru