| Содержание | Предыдущая статья | Следующая статья | Поиск |
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High-performance InGaP/GaAs -doped heterojunction
bipolar transistor
Jung-HuiTsai, Shao-YenChiu, Wen-ShiungLour, Der-FengGuo
Department of Electronic Engineering, National Kaohsiung Normal University,
Kaohsiung 802, TAIWAN
Department of Electrical Engineering, National Taiwan Ocean University,
Keelung, TAIWAN
Department of Electronic Engineering, Air Force Academy,
Kaohsiung, TAIWAN
(Получена 15 октября 2008 г. Принята к печати 17 ноября 2008 г.)
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In this article, a novel InGaP/GaAs -doped heterojunction bipolar transistor is first demonstrated. Though the valence band discontinuity at InGaP/GaAs heterojunction is relatively large, the addition of a -doped sheet between two spacer layers at the emitterbase (EB) junction effectively eliminates the potential spike and increases the confined barrier for electrons, simultaneously. Experimentally, a high current gain of 25 and a relatively low EB offset voltage of 60 mV are achieved. The offset voltage is much smaller than the conventional InGaP/GaAs HBT. The proposed device could be used for linear amplifiers and low-power complementary integrated circuit applications. PACS: 85.30.Pq, 73.40.Kp |
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