ФТП, 2007, том 41, выпуск 5

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Applying of EBIV technique for investigation
of electrophysical parameters of devices based on HTSC

S.V.Baryshev\kern1pt, A.V.Bobyl, O.P.Kostyleva

Ioffe Physicotechnical Institute, Russian Academy of Sciences,
194021 St. Petersburg, Russia

(Получена 22 сентября 2006 г. Принята к печати 3 октября 2006 г.)

The local investigations with 4 mum spatial resolution using EBIV-signal registration of YBCO microstripes were made with low-temperature scanning microscopy technique. These investigations coupled with microwave measurements of YBCO films (near-field microscopy) and structural investigations (X-ray diffractometry, SEM) gave the correlation between half-widths of temperature dependence of third harmonic power maximum WTH, EBIV-signal curve WEBIV and average microcrystallite size. In order to explain such dependence diphasic medium model considering non-linear voltage-current characteristic of superconductor was proposed. Calculations allow us to conclude, that triple increase of microcristallite size results in hundredfold reduction of non-linearity coefficient of YBCO films and microwave devices based on these films.

PACS: 74.25.Nf, 74.70.Ad, 74.72.Bk

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